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14-bit, 8-channel, 250 ksps pulsar adc ad7949 rev. a information furnished by analog devices is believed to be accurate and reliable. however, no responsibility is assumed by analog devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. specifications subject to change without notice. no license is granted by implication or otherwise under any patent or patent rights of analog devices. trademarks and registered trademarks are the property of their respective owners. one technology way, p.o. box 9106, norwood, ma 02062-9106, u.s.a. tel: 781.329.4700 www.analog.com fax: 781.461.3113 ?2008 analog devices, inc. all rights reserved. features 14-bit resolution with no missing codes 8-channel multiplexer with choice of inputs unipolar single ended differential (gnd sense) pseudobipolar throughput: 250 ksps inl/dnl: 0.5 lsb typical sinad: 85 db @ 20 khz thd: 100 db @ 20 khz analog input range: 0 v to v ref with v ref up to vdd multiple reference types internal selectable 2.5 v or 4.096 v external buffered (up to 4.096 v) external (up to vdd) internal temperature sensor channel sequencer, selectable 1-pole filter, busy indicator no pipeline delay, sar architecture single-supply 2.7 v to 5.5 v operation with 1.8 v to 5 v logic interface serial interface compatible with spi, microwire, qspi, and dsp power dissipation 2.9 mw @ 2.5 v/200 ksps 10.8 mw @ 5 v/250 ksps standby current: 50 na 20-lead 4 mm 4 mm lfcsp package applications battery-powered equipment medical instruments: ecg/ekg mobile communications: gps personal digital assistants power line monitoring data acquisition seismic data acquisition systems instrumentation process control functional block diagram ad7949 ref gnd vdd vio din sck sdo cnv 1.8v to vdd 2.7v to 5 v sequencer spi serial interface mux 16-bit sar adc band gap ref temp sensor refin in0 in1 in4 in5 in6 in7 in3 in2 com 0.5v to vdd 22f 0.5v to 4.096v 0.1f 07351-001 one-pole lpf figure 1. table 1. multichannel 14-/16-bit pulsar? adc type channels 250 ksps 500 ksps adc driver 14-bit 8 ad7949 ada4841-x 16-bit 4 AD7682 ada4841-x 16-bit 8 ad7689 ad7699 ada4841-x general description the ad7949 is an 8-channel, 14-bit, charge redistribution successive approximation register (sar) analog-to-digital converter (adc) that operates from a single power supply, vdd. the ad7949 contains all components for use in a multichannel, low power data acquisition system, including a true 14-bit sar adc with no missing codes; an 8-channel, low crosstalk multi- plexer useful for configuring the inputs as single ended (with or without ground sense), differential, or bipolar; an internal low drift reference (selectable 2.5 v or 4.096 v) and buffer; a temperature sensor; a selectable one-pole filter; and a sequencer that is useful when channels are continuously scanned in order. the ad7949 uses a simple spi interface for writing to the configuration register and receiving conversion results. the spi interface uses a separate supply, vio, which is set to the host logic level. power dissipation scales with throughput. the ad7949 is housed in a tiny 20-lead lfcsp with operation specified from ?40c to +85c.
ad7949 rev. a | page 2 of 28 table of contents features .............................................................................................. 1 applications ....................................................................................... 1 functional block diagram .............................................................. 1 general description ......................................................................... 1 revision history ............................................................................... 2 specifications ..................................................................................... 3 timing specifications ....................................................................... 6 absolute maximum ratings ............................................................ 8 esd caution .................................................................................. 8 pin configuration and function descriptions ............................. 9 typical performance characteristics ........................................... 10 ter mi nolo g y .................................................................................... 13 theory of operation ...................................................................... 14 overview ...................................................................................... 14 converter operation .................................................................. 14 transfer functions ...................................................................... 15 typical connection diagrams .................................................. 16 analog inputs ............................................................................. 17 driver amplifier choice ........................................................... 18 voltage reference output/input .............................................. 19 power supply ............................................................................... 20 supplying the adc from the reference .................................. 20 digital interface .............................................................................. 21 configuration register, cfg .................................................... 22 read/write spanning conversion without a busy indicator ............................................................................. 23 read/write spanning conversion with a busy indicator ..... 24 application hints ........................................................................... 25 layout .......................................................................................... 25 evaluating ad7949 performance ............................................. 25 outline dimensions ....................................................................... 26 ordering guide .......................................................................... 26 revision history 5/08rev. 0 to rev. a changes to ordering guide .......................................................... 26 5/08revision 0: initial version
ad7949 rev. a | page 3 of 28 specifications vdd = 2.5 v to 5.5 v, vio = 2.3 v to vdd, v ref = vdd, all specifications t min to t max , unless otherwise noted. table 2. parameter conditions/comments min typ max unit resolution 14 bits analog input voltage range unipolar mode 0 +v ref v bipolar mode ?v ref /2 +v ref /2 absolute input voltage positive input, unipolar and bipolar modes ?0.1 v ref + 0.1 v negative or com input, unipolar mode ?0.1 +0.1 negative or com input, bipolar mode v ref /2 ? 0.1 v ref /2 v ref /2 + 0.1 analog input cmrr f in = 250 khz 68 db leakage current at 25c acquisition phase 1 na input impedance 1 throughput conversion rate full bandwidth 2 vdd = 4.5 v to 5.5 v 0 250 ksps vdd = 2.3 v to 4.5 v 0 200 ksps ? bandwidth 2 vdd = 4.5 v to 5.5 v 0 62.5 ksps vdd = 2.3 v to 4.5 v 0 50 ksps transient response full-scale step, full bandwidth 1.8 s full-scale step, ? bandwidth 14.8 s accuracy no missing codes 14 bits integral linearity error ?1 0.5 +1 lsb 3 differential linearity error ?1 0.25 +1 lsb transition noise ref = vdd = 5 v 0.1 lsb gain error 4 ?5 0.5 +5 lsb gain error match ?1 0.2 +1 lsb gain error temperature drift 1 ppm/c offset error 4 0.5 lsb offset error match ?1 0.2 +1 lsb offset error temperature drift 1 ppm/c power supply sensitivity vdd = 5 v 5% 0.2 lsb
ad7949 rev. a | page 4 of 28 parameter conditions/comments min typ max unit ac accuracy 5 dynamic range 85.6 db 6 signal-to-noise f in = 20 khz, vref = 5 v 84.5 85.5 db f in = 20 khz, vref = 4.096 v internal ref 85 db f in = 20 khz, vref = 2.5 v internal ref 84 db sinad f in = 20 khz, vref = 5 v 84 85 db f in = 20 khz, vref = 5 v, ?60 db input 33.5 db f in = 20 khz, vref = 4.096 v internal ref 85 db f in = 20 khz, vref = 2.5 v internal ref 84 db total harmonic distortion f in = 20 khz ?100 db spurious-free dynamic range f in = 20 khz 108 db channel-to-channel crosstalk f in = 100 khz on adjacent channel(s) ?125 db sampling dynamics ?3 db input bandwidth selectable 0.425 1.7 mhz aperture delay vdd = 5 v 2.5 ns internal reference ref output voltage 2.5 v, @ 25c 2.490 2.500 2.510 v 4.096 v, @ 25c 4.086 4.096 4.106 v refin output voltage 7 2.5 v, @ 25c 1.2 v 4.096 v, @ 25c 2.3 v ref output current 300 a temperature drift 10 ppm/c line regulation vdd = 5 v 5% 15 ppm/v long-term drift 1000 hours 50 ppm turn-on settling time cref = 10 f 5 ms external reference voltage range ref input 0.5 vdd + 0.3 v refin input (buffered) 0.5 vdd ? 0.2 v current drain 250 ksps, ref = 5 v 50 a temperature sensor output voltage 8 @ 25c 283 mv temperature sensitivity 1 mv/c digital inputs logic levels v il ?0.3 +0.3 vio v v ih 0.7 vio vio + 0.3 v i il ?1 +1 a i ih ?1 +1 a digital outputs data format 9 pipeline delay 10 v ol isink = +500 a 0.4 v v oh isource = ?500 a vio ? 0.3 v
ad7949 rev. a | page 5 of 28 parameter conditions/comments min typ max unit power supplies vdd specified performance 2.3 5.5 v vio specified performance 2.3 vdd + 0.3 v operating range 1.8 vdd + 0.3 v standby current 11 , 12 vdd and vio = 5 v, @ 25c 50 na power dissipation vdd = 2.5 v, 100 sps throughput 1.5 w vdd = 2.5v, 100 ksps throughput 1.45 2.0 mw vdd = 2.5 v, 200 ksps throughput 2.9 4.0 mw vdd = 5 v , 250 ksps throughput 10.8 12.5 mw vdd = 5 v, 250 ksps throughput with internal reference 13.5 15.5 mw energy per conversion 50 nj temperature range 13 specified performance t min to t max ?40 +85 c 1 see the analog inputs section. 2 the bandwidth is set with the configuration register 3 lsb means least significant bit. with the 5 v input range, one lsb = 305 v. 4 see the terminology section. these specif ications include full temperature range variation but not the error contribution from the external reference. 5 with vdd = 5 v, unless otherwise noted. 6 all specifications expressed in decibels are referred to a full-scale input fsr and tested with an input signal at 0.5 db belo w full scale, unless otherwise specified. 7 this is the output from the internal band gap. 8 the output voltage is internal and pr esent on a dedicated multiplexer input. 9 unipolar mode: serial 14-bit straight binary. bipolar mode: serial 14- bit twos complement. 10 conversion results available immediately after completed conversion. 11 with all digital inputs forced to vio or gnd as required. 12 during acquisition phase. 13 contact an analog devices, inc., sales representative for the extended temperature range.
ad7949 rev. a | page 6 of 28 timing specifications vdd = 4.5 v to 5.5 v, vio = 2.3 v to vdd, all specifications t min to t max , unless otherwise noted. table 3. 1 parameter symbol min typ max unit conversion time: cnv rising edge to data available t conv 2.2 s acquisition time t acq 1.8 s time between conversions t cyc 4 s cnv pulse width t cnvh 10 ns data write/read during conversion t data 1.0 s sck period t sck 15 ns sck low time t sckl 7 ns sck high time t sckh 7 ns sck falling edge to data remains valid t hsdo 4 ns sck falling edge to data valid delay t dsdo vio above 4.5 v 16 ns vio above 3 v 17 ns vio above 2.7 v 18 ns vio above 2.3 v 19 ns cnv low to sdo d15 msb valid t en vio above 4.5 v 15 ns vio above 3 v 17 ns vio above 2.7 v 18 ns vio above 2.3 v 22 ns cnv high or last sck falling edge to sdo high impedance t dis 25 ns cnv low to sck rising edge t clsck 10 ns din valid setup time from sck falling edge t sdin 4 ns din valid hold time from sck falling edge t hdin 4 ns 1 see figure 2 and figure 3 for load conditions.
ad7949 rev. a | page 7 of 28 vdd = 2.3 v to 4.5 v , vio = 2.3 v to vdd, all specifications t min to t max , unless otherwise noted. table 4. 1 parameter symbol min typ max unit conversion time: cnv rising edge to data available t conv 3.2 s acquisition time t acq 1.8 s time between conversions t cyc 5 s cnv pulse width t cnvh 10 ns data write/read during conversion t data 1.0 s sck period t sck 25 ns sck low time t sckl 12 ns sck high time t sckh 12 ns sck falling edge to data remains valid t hsdo 5 ns sck falling edge to data valid delay t dsdo vio above 3 v 24 ns vio above 2.7 v 30 ns vio above 2.3 v 37 ns cnv low to sdo d15 msb valid t en vio above 3 v 21 ns vio above 2.7 v 27 ns vio above 2.3 v 35 ns cnv high or last sck falling edge to sdo high impedance t dis 50 ns cnv low to sck rising edge t clsck 10 ns sdi valid setup time from sck falling edge t sdin 5 ns sdi valid hold time from sck falling edge t hdin 5 ns 1 see figure 2 and figure 3 for load conditions. i ol 500a 500a i oh 1.4v t osdo c l 50pf 07351-002 figure 2. load circuit fo r digital interface timing 3 0% vio 70% vio 2v or vio ? 0.5v 1 0.8v or 0.5v 2 0.8v or 0.5v 2 2v or vio ? 0.5v 1 t delay t delay 1 2v if vio above 2.5v, vio ? 0.5v if vio below 2.5v. 2 0.8v if vio above 2.5v, 0.5v if vio below 2.5v. 07351-003 figure 3. voltage levels for timing
ad7949 rev. a | page 8 of 28 absolute maximum ratings table 5. parameter rating analog inputs inx, 1 com 1 gnd ? 0.3 v to vdd + 0.3 v or vdd 130 ma ref, refin gnd ? 0.3 v to vdd + 0.3 v supply voltages vdd, vio to gnd ?0.3 v to +7 v vdd to vio 7 v din, cnv, sck to gnd 2 ?0.3 v to vio + 0.3 v sdo to gnd ?0.3 v to vio + 0.3 v storage temperature range ?65c to +150c junction temperature 150c ja thermal impedance (lfcsp) 47.6c/w jc thermal impedance (lfcsp) 4.4c/w 1 see the analog inputs section. 2 cnv must be low during power up. see the power supply section. stresses above those listed under absolute maximum ratings may cause permanent damage to the device. this is a stress rating only; functional operation of the device at these or any other conditions above those indicated in the operational section of this specification is not implied. exposure to absolute maximum rating conditions for extended periods may affect device reliability. esd caution
ad7949 rev. a | page 9 of 28 pin configuration and fu nction descriptions pin 1 indicator 1 vdd 2 ref 3 refin 4 gnd 5 gnd 13 sck 14 sdo 15 vio 12 din 11 cnv 6 i n 4 7 i n 5 8 i n 6 0 1 c o m 9 i n 7 8 1 i n 2 9 1 i n 3 0 2 v d d 7 1 i n 1 6 1 i n 0 top view (not to scale) ad7949 07351-004 figure 4. 20-lead lfcsp pin configuration table 6. pin function descriptions pin no. mnemonic type 1 description 1, 20 vdd p power supply. nominally 2.5 v to 5.5 v when usin g an external reference and decoupled with 10 f and 100 nf capacitors. when using the internal reference for 2.5 v output, the minimum should be 3.0 v. when using the internal reference for 4.096 v output, the minimum should be 4.5 v. 2 ref ai/o reference input/output. see the voltage reference output/input section. when the internal reference is enabled, this pin produces a selectable system reference = 2.5 v or 4.096 v. when the internal reference is disabled and th e buffer is enabled, ref produces a buffered version of the voltage present on the refin pin (4.096 v maximum) useful when using low cost, low power references. for improved drift performance, connect a precision reference to ref (0.5 v to vdd). for any reference method, this pin needs deco upling with an external 10 f capacitor connected as close to ref as possible. see the reference decoupling section. 3 refin ai/o internal reference output/reference buffer input. see the voltage reference output/input section. when using the internal reference, the internal unbuffered reference voltage is present and needs decoupling with a 0.1f capacitor. when using the internal reference buffer, appl y a source between 0.5 v and 4.096 v that is buffered to the ref pin as described above. 4, 5 gnd p power supply ground. 6 to 9 in4 to in7 ai channel 4 through channel 7 analog inputs. 10 com ai common channel input. all channels [7:0] can be referenced to a common mode point of 0 v or v ref /2 v. 11 cnv di convert input. on the rising edge, cnv initiates the conversion. during conversion, if cnv is held high, the busy indictor is enabled. 12 din di data input. this input is used for writing to the 14-bit configuration register. the configuration register can be written to during and after conversion. 13 sck di serial data clock input. this inp ut is used to clock out the data on ado and clock in data on din in an msb first fashion. 14 sdo do serial data output. the conversion result is output on this pin synchronized to sck. in unipolar modes, conversion results are straight binary; in bipolar modes, conversion results are twos complement. 15 vio p input/output interface digital power. nominally at the same supply as the host interface (1.8 v, 2.5 v, 3 v, or 5 v). 16 to 19 in0 to in3 ai channel 0 through channel 3 analog inputs. 1 ai = analog input, ai/o = analog input/output, di = digital input, do = digital output, and p = power.
ad7949 rev. a | page 10 of 28 typical performance characteristics vdd = 2.5 v to 5.5 v, vref = 2.5 v to 5 v, vio = 2.3 v to vdd 1.0 0.5 0 ?0.5 ?1.0 0 4,096 8,192 12,288 16,384 inl (lsb) codes 07351-006 figure 5. integral nonlinearity vs. code, vref = vdd = 5 v 300k 250k 200k 150k 100k 50k 0 1ffc counts code in hex 1ffd 1ffe 1fff 2000 2001 2002 2003 00010000 v ref = vdd = 5v 261,120 07351-007 figure 6. histogram of a dc input at code center 0 ?20 ?40 ?60 ?80 ?100 ?120 ?140 ?160 05 0 25 75 100 125 amplitude (db of full-scale) frequency (khz) v ref = vdd = 5v f s = 250ksps f in = 19.9khz snr = 85.3db sinad = 85.2db thd = ?100db sfdr = 103db second harmonic = ?110db third harmonic = ?103db 07351-008 figure 7. 20 khz fft, vref = vdd = 5 v dnl (lsb) codes 07351-009 0 4,096 8,192 12,288 16,384 1.0 0.5 0 ?0.5 ?1.0 figure 8. differential nonlineari ty vs. code, vref = vdd = 5 v counts code in hex 259,473 07351-010 300k 250k 200k 150k 100k 50k 0 1ffc 1ffd 1ffe 1fff 2000 2001 2002 2003 2004 00 0 955 693 00 0 v ref = v dd = 2.5v figure 9. histogram of a dc input at code center 0 ?20 ?40 ?60 ?80 ?100 ?120 ?140 ?160 ?180 05 0 25 75 100 amplitude (db of full-scale) frequency (khz) v ref = vdd = 2.5v f s = 200ksps f in = 19.9khz snr = 84.2db sinad = 82.4db thd = ?84db sfdr = 85db second harmonic = ?100db third harmonic = ?85db 07351-011 figure 10. 20 khz fft, vref = vdd = 2.5 v
ad7949 rev. a | page 11 of 28 90 85 80 75 70 65 60 0 50 100 150 200 snr (db) frequency (khz) vdd = v ref = 5v, ?0.5db vdd = v ref = 5v, ?10db vdd = v ref = 2.5v, ?0.5db vdd = v ref = 2.5v, ?10db 07351-041 figure 11. snr vs. frequency 88 86 84 82 80 78 15.5 15.0 14.5 14.0 13.5 13.0 1.0 snr, sinad (db) enob (bits) reference voltage (v) 1.5 2.0 2.5 3.0 3.5 4.0 4.5 5.0 5.5 07351-013 snr sinad enob figure 12. snr, sinad, and enob vs. reference voltage 90 85 80 75 70 65 60 ?55 snr (db) temperature (c) ?35 ?15 5 25 45 65 85 105 125 f in = 20khz vdd = v ref = 5v vdd = v ref = 2.5v 07351-014 figure 13. snr vs. temperature 90 85 80 75 70 65 60 0 50 100 150 200 sinad (db) frequency (khz) vdd = v ref = 5v, ?0.5db vdd = v ref = 5v, ?10db vdd = v ref = 2.5v, ?0.5db vdd = v ref = 2.5v, ?10db 07351-012 figure 14. sinad vs. frequency 130 125 120 115 110 105 100 95 90 85 80 75 70 1.0 sfdr (db) ? 60 ?65 ?70 ?75 ?80 ?85 ?90 ?95 ?100 ?105 ?110 ?115 ?120 thd (db) reference voltage (v) 1.5 2.0 2.5 3.0 3.5 4.0 4.5 5.0 5.5 sfdr thd 07351-016 figure 15. sfdr and thd vs. reference voltage ? 90 ?95 ?100 ?105 ?110 ?55 thd (db) temperature (c) ?35 ?15 5 25 45 65 85 105 125 f in = 20khz vdd = v ref = 5v vdd = v ref = 2.5v 07351-017 figure 16. thd vs. temperature
ad7949 rev. a | page 12 of 28 ? 60 ?70 ?80 ?90 ?100 ?110 ?120 0 50 100 150 200 thd (db) frequency (khz) vdd = v ref = 5v, ?0.5db vdd = v ref = 2.5v, ?0.5db vdd = v ref = 2.5v, ?10db vdd = v ref = 5v, ?10db 07351-015 2750 2500 2250 2000 1750 1500 1250 1000 750 100 90 80 70 60 50 40 30 20 2.5 3.0 3.5 4.0 4.5 5.0 5.5 vdd current (a) vio current (a) vdd supply (v) 2.5v internal ref 4.096v internal ref internal buffer, temp on internal buffer, temp off external ref, temp on external ref, temp off vio f s = 200ksps 07351-021 figure 17. thd vs. frequency figure 20. operating currents vs. supply 90 89 88 87 86 85 84 83 82 81 80 79 78 ?10 snr (db) input level (db) ?8 ?6 ?2 0 ?4 f in = 20khz vdd = v ref = 2.5v 07351-018 vdd = v ref = 5v 3000 2750 2500 2250 2000 1750 1500 1250 1000 180 160 140 120 100 80 60 40 20 vdd current (a) ?55 temperature (c) ?35 ?15 5 25 45 65 85 105 125 f s = 200ksps vdd = 5v, internal 4.096v ref vdd = 5v, external ref vdd = 2.5, external ref vio 07351-022 figure 18. snr vs. input level figure 21. operating currents vs. temperature 2 1 0 ?1 ?2 offset error and gain error (lsb) ?55 temperature (c) ?35 ?15 5 25 45 65 85 105 125 unipolar zero unipolar gain bipolar zero bipolar gain 07351-020 sdo capacitive load (pf) 120 0 20406080100 t dsdo del a y (ns) 25 20 15 10 5 0 vdd = 2.5v, 85c vdd = 3.3v, 25c vdd = 3.3v, 85c vdd = 5v, 85c vdd = 5v, 25c vdd = 2.5v, 25c 0 7351-023 figure 19. offset and gain errors vs. temperature figure 22. t dsdo delay vs. sdo capacitance load and supply
ad7949 rev. a | page 13 of 28 terminology least significant bit (lsb) the lsb is the smallest increment that can be represented by a converter. for an analog-to-digital converter with n bits of resolution, the lsb expressed in volts is n ref v lsb 2 (v) = integral nonlinearity error (inl) inl refers to the deviation of each individual code from a line drawn from negative full scale through positive full scale. the point used as negative full scale occurs ? lsb before the first code transition. positive full scale is defined as a level 1? lsb beyond the last code transition. the deviation is measured from the middle of each code to the true straight line (see figure 24 ). differential nonlinearity error (dnl) in an ideal adc, code transitions are 1 lsb apart. dnl is the maximum deviation from this ideal value. it is often specified in terms of resolution for which no missing codes are guaranteed. offset error the first transition should occur at a level ? lsb above analog ground. the unipolar offset error is the deviation of the actual transition from that point. gain error the last transition (from 111 10 to 111 11) should occur for an analog voltage 1? lsb below the nominal full scale. the gain error is the deviation in lsb (or percentage of full-scale range) of the actual level of the last transition from the ideal level after the offset error is adjusted out. closely related is the full-scale error (also in lsb or percentage of full-scale range), which includes the effects of the offset error. aperture delay aperture delay is the measure of the acquisition performance. it is the time between the rising edge of the cnv input and the point at which the input signal is held for a conversion. transient resp onse transient response is the time required for the adc to accurately acquire its input after a full-scale step function is applied. dynamic range dynamic range is the ratio of the rms value of the full scale to the total rms noise measured with the inputs shorted together. the value for dynamic range is expressed in decibels. signal-to-noise ratio (snr) snr is the ratio of the rms value of the actual input signal to the rms sum of all other spectral components below the nyquist frequency, excluding harmonics and dc. the value for snr is expressed in decibels. signal-to-(noise + distortion) ratio (sinad) sinad is the ratio of the rms value of the actual input signal to the rms sum of all other spectral components below the nyquist frequency, including harmonics but excluding dc. the value for sinad is expressed in decibels. total harmonic distortion (thd) thd is the ratio of the rms sum of the first five harmonic components to the rms value of a full-scale input signal and is expressed in decibels. spurious-free dynamic range (sfdr) sfdr is the difference, in decibels, between the rms amplitude of the input signal and the peak spurious signal. effective number of bits (enob) enob is a measurement of the resolution with a sine wave input. it is related to sinad by the formula enob = ( sinad db ? 1.76)/6.02 and is expressed in bits. channel-to-channel crosstalk channel-to-channel crosstalk is a measure of the level of crosstalk between any two adjacent channels. it is measured by applying a dc to the channel under test and applying a full-scale, 100 khz sine wave signal to the adjacent channel(s). the crosstalk is the amount of signal that leaks into the test channel and is expressed in decibels. reference voltage temperature coefficient reference voltage temperature coefficient is derived from the typical shift of output voltage at 25c on a sample of parts at the maximum and minimum reference output voltage (v ) meas- ured at t , t (25c), and t . it is expressed in ppm/c as ref min max 6 10 )C()c25( )(C)( )cppm/( = min max ref ref ref ref tt v minvmaxv tcv where: v ref ( max ) = maximum v ref at t min , t (25c), or t max . v ref ( min ) = minimum v ref at t min , t (25c), or t max . v ref (25 c ) = v ref at 25c. t max = +85c. t min = C40c.
ad7949 rev. a | page 14 of 28 theory of operation sw+ msb 4,096c lsb comp control logic switches control busy output code cnv ref gnd com 4c 2c c c 8,192c sw? msb 4,096c lsb 4c 2c c c 8,192c 07351-026 inx+ inx? or figure 23. adc simplified schematic overview the ad7949 is an 8-channel, 14-bit, charge redistribution successive approximation register (sar) analog-to-digital converter (adc). the ad7949 is capable of converting 250,000 samples per second (250 ksps) and powers down between conversions. for example, when operating with an external reference at 1 ksps, it consumes 15 w typically, ideal for battery-powered applications. the ad7949 contains all of the components for use in a multi- channel, low power, data acquisition system, including ? 14-bit sar adc with no missing codes ? 8-channel, low crosstalk multiplexer ? internal low drift reference and buffer ? temp er ature s e ns or ? selectable one-pole filter ? channel sequencer these components are configured through an spi-compatible, 14-bit register. conversion results, also spi compatible, can be read after or during conversions with the option for reading back the current configuration. the ad7949 provides the user with an on-chip track-and-hold and does not exhibit pipeline delay or latency. the ad7949 is specified from 2.3 v to 5.5 v and can be interfaced to any 1.8 v to 5 v digital logic family. it is housed in a 20-lead, 4 mm 4 mm lfcsp that combines space savings and allows flexible configurations. it is pin-for-pin compatible with the 16-bit AD7682 , ad7699 , and ad7689 . converter operation the ad7949 is a successive approximation adc based on a charge redistribution dac. figure 23 shows the simplified schematic of the adc. the capacitive dac consists of two identical arrays of 14 binary-weighted capacitors, which are connected to the two comparator inputs. during the acquisition phase, terminals of the array tied to the comparator input are connected to gnd via sw+ and sw?. all independent switches are connected to the analog inputs. thus, the capacitor arrays are used as sampling capacitors and acquire the analog signal on the inx+ and inx? (or com) inputs. when the acquisition phase is complete and the cnv input goes high, a conversion phase is initiated. when the conversion phase begins, sw+ and sw? are opened first. the two capacitor arrays are then disconnected from the inputs and connected to the gnd input. therefore, the differential voltage between the inx+ and inx? (or com) inputs captured at the end of the acquisition phase is applied to the comparator inputs, causing the comparator to become unbalanced. by switching each element of the capacitor array between gnd and cap, the comparator input varies by binary-weighted voltage steps (v ref /2, v ref /4, ... v ref /16,384). the control logic toggles these switches, starting with the msb, to bring the comparator back into a balanced condition. after the completion of this process, the part returns to the acquisition phase, and the control logic generates the adc output code and a busy signal indicator. because the ad7949 has an on-board conversion clock, the serial clock, sck, is not required for the conversion process.
ad7949 rev. a | page 15 of 28 transfer functions with the inputs configured for unipolar range (single ended, com with ground sense, or paired differentially with inx? as ground sense), the data output is straight binary. with the inputs configured for bipolar range (com = v ref /2 or paired differentially with inx? = v ref /2), the data outputs are twos complement. the ideal transfer characteristic for the ad7949 is shown in figure 24 and for both unipolar and bipolar ranges with the internal 4.096 v reference. 100...000 100...001 100...010 011...101 011...110 011...111 twos complement straight binary 000...000 000...001 000...010 111...101 111...110 111...111 adc code analog input +fsr ? 1.5lsb +fsr ? 1lsb ?fsr + 1lsb ?fsr ?fsr + 0.5lsb 07351-027 figure 24. adc ideal transfer function table 7. output codes and ideal input voltages description unipolar analog input 1 v ref = 4.096 v digital output code (straight binary hex) bipolar analog input 2 v ref = 4.096 v digital output code (twos complement hex) fsr ? 1 lsb 4.095750 v 0x3fff 2.047750 v 0x1fff midscale + 1 lsb 2.048250 v 0x2001 250 v 0x0001 midscale 2.048 v 0x2000 0 0x0000 4 midscale ? 1 lsb 2.04775 v 0x1fff ?250 v 0x3fff 3 ?fsr + 1 lsb 250 v 0x0001 ?2.047750 v 0x2001 ?fsr 0 v 0x0000 ?2.048 v 0x2000 1 with com or inx? = 0 v or all inx referenced to gnd. 2 with com or inx? = v ref /2. 3 this is also the code for an overranged analog input ((inx+) ? (inx?), or com, above v ref ? v gnd ). 4 this is also the code for an underranged analog input ((inx+) ? (inx?), or com, below v gnd ).
ad7949 rev. a | page 16 of 28 typical connection diagrams ad7949 ref gnd vdd vio din mosi miso ss sck sck sdo cnv 100nf 100nf 5 v 10f 2 v+ v? 1.8v to vdd 0v to v ref 0v to v ref v+ v? ada4841-x 3 ada4841-x 3 in0 inx com refin 100nf 0v or v ref /2 07351-028 1. internal reference shown. see voltage reference output/input section for reference selection. notes: 2. c ref is usually a 10f ceramic capacitor (x5r). 3. see driver amplifier choice section for additional recommended amplifiers. 4. see the digital interface section for configuring and reading conversion data. figure 25. typical application diagram with multiple supplies ad7949 ref gnd vdd vio din mosi miso ss sck sck sdo cnv 100nf 100nf 5 v 10f 2 v+ 1.8v to vdd v+ in0 inx com refin 100nf v ref /2 v ref p-p ada4841-x 3 ada4841-x 3 07351-029 notes: 1. internal reference shown. see voltage reference output/input section for reference selection. 2. c ref is usually a 10f ceramic capacitor (x5r). 3. see driver amplifier choice section for additional recommended amplifiers. 4. see the digital interface section for configuring and reading conversion data. figure 26. typical bipolar application diagram
ad7949 rev. a | page 17 of 28 unipolar or bipolar figure 25 shows an example of the recommended connection diagram for the ad7949 when multiple supplies are available. bipolar single supply figure 26 shows an example of a system with a bipolar input using single supplies with the internal reference (optional different vio supply). this circuit is also useful when the amplifier/signal conditioning circuit is remotely located with some common mode present. note that for any input configuration, the inputs inx are unipolar and always referenced to gnd. r1, r2 and r1, and r2 add common mode to the amplifier, a1, and com, respectively. for this circuit, a rail-to-rail input/output amplifier can be used; however, the offset voltage vs. input common-mode range should be noted and taken into consideration (1 lsb = 76.3 v with v ref = 5 v). note that the conversion results are in twos complement format when using the bipolar input configuration. refer to the an-581 application note for additional details about using single-supply amplifiers. analog inputs input structure figure 27 shows an equivalent circuit of the input structure of the ad7949. the two diodes, d1 and d2, provide esd protection for the analog inputs, in[7:0] and com. care must be taken to ensure that the analog input signal does not exceed the supply rails by more than 0.3 v because this causes the diodes to become forward biased and to start conducting current. these diodes can handle a forward-biased current of 130 ma maximum. for instance, these conditions may eventually occur when the input buffer supplies are different from vdd. in such a case, for example, an input buffer with a short circuit, the current limitation can be used to protect the part. c in r in d1 d2 c pin gnd v dd 07351-030 inx+ or inx? or com figure 27. equivalent analog input circuit this analog input structure allows the sampling of the true differential signal between inx+ and com or inx+ and inx?. (com or inx? = gnd 0.1 v or v ref 0.1 v). by using these differential inputs, signals common to both inputs are rejected, as shown in figure 28 . 70 65 60 55 50 45 40 35 30 1 10k 10 cmrr (db) 100 1k frequency (khz) 07351-031 figure 28. analog input cmrr vs. frequency during the acquisition phase, the impedance of the analog inputs can be modeled as a parallel combination of the capacitor, c pin , and the network formed by the series connection of r in and c in . c pin is primarily the pin capacitance. r in is typically 3.5 k and is a lumped component made up of serial resistors and the on resistance of the switches. c in is typically 27 pf and is mainly the adc sampling capacitor. selectable low pass filter during the conversion phase, where the switches are opened, the input impedance is limited to c pin . while the ad7949 is acquiring, r in and c in make a one-pole, low-pass filter that reduces undesirable aliasing effects and limits the noise from the driving circuitry. the low pass filter can be programmed for the full bandwidth or ? of the bandwidth with cfg[6] as shown in table 9 . note that the converters throughout must also be reduced by ? when using the filter. if the maximum throughput is used with the bw set to ?, the converter acquisition time, t acq , will be violated, resulting in increased thd. input configurations figure 29 shows the different methods for configuring the analog inputs with the configuration register (cfg[12:10]). refer to the configuration register, cfg , section for more details.
ad7949 rev. a | page 18 of 28 gnd com ch0+ ch3+ ch1+ ch2+ ch4+ ch5+ ch6+ ch7+ ch0+ ch3+ ch1+ ch2+ ch4+ ch5+ ch6+ ch7+ com? gnd com in1 in0 in2 in3 in4 in5 in6 in7 in1 in0 in2 in3 in4 in5 in6 in7 in1 in0 in2 in3 in4 in5 in6 in7 in1 in0 in2 in3 in4 in5 in6 in7 a?8 channels, single ended b?8 channels, common refernce gnd com ch0+ (?) ch1+ (?) ch2+ (?) ch3+ (?) ch0? (+) ch1? (+) ch0+ (?) ch1+ (?) ch0? (+) ch1? (+) ch2? (+) ch3? (+) c?4 channels, differential gnd com ch2+ ch3+ ch4+ ch5+ d?combination com? 07351-032 figure 29. multiplexed analog input configuraitons the analog inputs can be configured as ? figure 29 a, single ended referenced to system ground; cfg[12:10] = 111 2 . ? figure 29 b, bipolar differential with a common reference point; com = v ref /2; cfg[12:10] = 010 2 . unipolar differential with com connected to a ground sense; cfg[12:10] = 110 2 . ? figure 29 c, bipolar differential pairs with inx? referenced to v ref /2; cfg[12:10] = 00x 2 . unipolar differential pairs with inx? referenced to a ground sense; cfg[12:10] = 10x 2 . in this configuration, the inx+ is identified by the channel in cfg[9:7]. example: for in0 = in1+ and in1 = in1?, cfg[9:7] = 000 2 ; for in1 = in1+ and in0 = in1?, cfg[9:7] = 001 2 . ? figure 29 d, inputs configured in any of the above combin- ations (showing that the ad7949 can be configured dynamically). sequencer the ad7949 includes a channel sequencer useful for scanning channels in a in0 to inx fashion. channels are scanned as singles or pairs, with or without the temperature sensor, after the last channel is sequenced. the sequencer starts with in0 and finishes with inx set in cfg[9:7]. for paired channels, the channels are paired depending on the last channel set in cfg[9:7]. note that the channel pairs are always paired in (even) = inx+ and in (odd) = inx? regardless of cfg[7]. to enable the sequencer, cfg[2:1] are written to for initializing the sequencer. after cfg[13:0] is updated, din must be held low while reading data out (at least for bit 13), or the cfg will begin updating again. while operating in a sequence, the cfg can be changed by writing 01 2 to cfg[2:1]. however, if changing cfg11 (paired or single channel) or cfg[9:7] (last channel in sequence), the sequence reinitializes and converts in0 (or in1) after cfg is updated. examples only the bits for input and sequencer are highlighted. as a first example, scan all in[7:0] referenced to com = gnd with temperature sensor. 13 12 11 10 9 8 7 6 5 4 3 2 1 0 cfg incc inx bw ref seq rb - 1 1 0 1 1 1 - - - - 1 0 - as a second example, scan three paired channels without temperature sensor and referenced to v ref /2. 13 12 11 10 9 8 7 6 5 4 3 2 1 0 cfg incc inx bw ref seq rb - 0 0 x 1 0 x - - - - 1 1 - source resistance when the source impedance of the driving circuit is low, the ad7949 can be driven directly. large source impedances significantly affect the ac performance, especially total harmonic distortion (thd). the dc performances are less sensitive to the input impedance. the maximum source impedance depends on the amount of thd that can be tolerated. driver amplifier choice although the ad7949 is easy to drive, the driver amplifier must meet the following requirements: ? the noise generated by the driver amplifier must be kept as low as possible to preserve the snr and transition noise performance of the ad7949. note that the ad7949 has a noise much lower than most of the other 14-bit adcs and, therefore, can be driven by a noisier amplifier to meet a given system noise specification. the noise from the amplifier is filtered by the ad7949 analog input circuit low-pass filter made by r in and c in or by an external filter, if one is used. ? for ac applications, the driver should have a thd performance commensurate with the ad7949. figure 17 shows thd vs. frequency for the ad7949.
ad7949 rev. a | page 19 of 28 ? for multichannel, multiplexed applications on each input or input pair, the driver amplifier and the ad7949 analog input circuit must settle a full-scale step onto the capacitor array at a 14-bit level (0.0015%). in the amplifier data sheet, settling at 0.1% to 0.01% is more commonly specified. this may differ significantly from the settling time at a 14-bit level and should be verified prior to driver selection. table 8. recommended driver amplifiers amplifier typical application ada4841-x very low noise, small, and low power ad8655 5 v single supply, low noise ad8021 very low noise and high frequency ad8022 low noise and high frequency op184 low power, low noise, and low frequency ad8605 , ad8615 5 v single supply, low power voltage reference output/input the ad7949 allows the choice of a very low temperature drift internal voltage reference, an external reference, or an external buffered reference. the internal reference of the ad7949 provides excellent perfor- mance and can be used in almost all applications. there are six possible choices of voltage reference schemes briefly described in table 9 with more details in each of the following sections. internal reference/temperature sensor the internal reference can be set for either 2.5 v or a 4.096 v output as detailed in table 9 . with the internal reference enabled, the band gap voltage is also present on the refin pin, which requires an external 0.1 f capacitor. because the current output of refin is limited, it can be used as a source if followed by a suitable buffer, such as the ad8605 . enabling the reference also enables the internal temperature sensor, which measures the internal temperature of the ad7949 and is thus useful for performing a system calibration. note that, when using the temperature sensor, the output is straight binary referenced from the ad7949 gnd pin. the internal reference is temperature-compensated to within 15 mv. the reference is trimmed to provide a typical drift of 3 ppm/c. external reference and internal buffer for improved drift performance, an external reference can be used with the internal buffer. the external reference is con- nected to refin, and the output is produced on the ref pin. an external reference can be used with the internal buffer with or without the temperature sensor enabled. refer to table 9 for the register details. with the buffer enabled, the gain is unity and is limited to an input/output of 4.096 v. the internal reference buffer is useful in multiconverter appli- cations because a buffer is typically required in these applications. in addition, a low power reference can be used because the internal buffer provides the necessary performance to drive the sar architecture of the ad7949. external reference in any of the six voltage reference schemes, an external reference can be connected directly on the ref pin because the output impedance of ref is >5 k. to reduce power consumption, the reference and buffer can be powered down independently or together for the lowest power consumption. however, for applications requiring the use of the temperature sensor, the reference must be active. refer to table 9 for register details. for improved drift performance, an external reference such as the adr43x or adr44x is recommended. reference decoupling whether using an internal or external reference, the ad7949 voltage reference output/input, ref, has a dynamic input impedance and should therefore be driven by a low impedance source with efficient decoupling between the ref and gnd pins. this decoupling depends on the choice of the voltage reference but usually consists of a low esr capacitor connected to ref and gnd with minimum parasitic inductance. a 10 f (x5r, 1206 size) ceramic chip capacitor is appropriate when using the internal reference, the adr43x / adr44x external reference, or a low impedance buffer such as the ad8031 or the ad8605 . the placement of the reference decoupling capacitor is also important to the performance of the ad7949, as explained in the layout section. the decoupling capacitor should be mounted on the same side as the adc at the ref pin with a thick pcb trace. the gnd should also connect to the reference decoupling capacitor with the shortest distance and to the analog ground plane with several vias. if desired, smaller reference decoupling capacitor values down to 2.2 f can be used with a minimal impact on performance, especially on dnl. regardless, there is no need for an additional lower value ceramic decoupling capacitor (for example, 100 nf) between the ref and gnd pins. for applications that use multiple ad7949s or other pulsar devices, it is more effective to use the internal reference buffer to buffer the external reference voltage, thus reducing sar conversion crosstalk. the voltage reference temperature coefficient (tc) directly impacts full scale; therefore, in applications where full-scale accuracy matters, care must be taken with the tc. for instance, a 61 ppm/c tc of the reference changes full scale by 1 lsb/c.
ad7949 rev. a | page 20 of 28 power supply the ad7949 uses three power supply pins: two core supplies (vdd) and a digital input/output interface supply (vio). vio allows direct interface with any logic between 1.8 v and vdd. to reduce the supplies needed, the vio and vdd pins can be tied together. the ad7949 is independent of power supply sequencing between vio and vdd. the only restriction is that cnv must be low during power up. additionally, it is very insensitive to power supply variations over a wide frequency range, as shown in figure 30 . 75 70 65 60 55 50 45 40 35 30 1 10k 10 pssr (db) 100 1k frequency (khz) 07351-034 figure 30. psrr vs. frequency the ad7949 powers down automatically at the end of each conversion phase; therefore, the operating currents and power scale linearly with the sampling rate. this makes the part ideal for low sampling rates (even of a few hertz) and low battery- powered applications. 10000 1000 100 10 1 0.1 0.010 0.001 10 1m 100 operating current (a) 1k 10k 100k sampling rate (sps) vdd = 5v, internal ref vdd = 5v, external ref vdd = 2.5v, external ref vio 07351-040 figure 31. operating currents vs. sampling rate supplying the adc from the reference for simplified applications, the ad7949, with its low operating current, can be supplied directly using the reference circuit as shown in figure 32 . the reference line can be driven by ? the system power supply directly ? a reference voltage with enough current output capability, such as the adr43x / adr44x ? a reference buffer, such as the ad8605 , which can also filter the system power supply, as shown in figure 32 ad8605 ad7949 vio ref vdd 10f 1f 0.1f 10 ? 10k ? 5v 5v 5v 1f 1 1 optional reference buffer and filter. 0.1f 0 7351-035 figure 32. example of an application circuit
ad7949 rev. a | page 21 of 28 digital interface the ad7949 uses a simple 4-wire interface and is compatible with spi, microwire?, qspi?, digital hosts, and dsps, for example, blackfin? adsp-bf53x, sharc?, adsp-219x, and adsp-218x. the interface uses the cnv, din, sck, and sdo signals and allows cnv, which initiates the conversion, to be independent of the readback timing. this is useful in low jitter sampling or simultaneous sampling applications. a 14-bit register, cfg[13:0], is used to configure the adc for the channel to be converted, the reference selection, and other components, which are detailed in the configuration register, cfg , section. when cnv is low, reading/writing can occur during conversion, acquisition, and spanning conversion (acquisition plus conversion), as detailed in the following sections. the cfg word is updated on the first 14 sck rising edges, and conversion results are read back on the first 13 (or 14 if busy mode is selected) sck falling edges. if the cfg readback is enabled, an additional 14 sck falling edges are required to read back the cfg word associated with the conversion results with the cfg msb following the lsb of the conversion result. a discontinuous sck is recommended because the part is selected with cnv low and sck activity begins to write a new configuration word and clock out data. note that in the following sections, the timing diagrams indicate digital activity (sck, cnv, din, sdo) during the conversion. however, due to the possibility of performance degradation, digital activity should occur only prior to the safe data reading/writing time, t data , because the ad7949 provides error correction circuitry that can correct for an incorrect bit during this time. from t data to t conv , there is no error correction and conversion results may be corrupted. the user should configure the ad7949 and initiate the busy indicator (if desired) prior to t data . it is also possible to corrupt the sample by having sck or din transitions near the sampling instant. therefore, it is recommended to keep the digital pins quiet for approximately 30 ns before and 10 ns after the rising edge of cnv, using a discontinuous sck whenever possible to avoid any potential performance degradation. reading/writing during conversion, fast hosts when reading/writing during conversion (n), conversion results are for the previous (n ? 1) conversion, and writing the cfg is for the next (n + 1) acquisition and conversion. after the cnv is brought high to initiate conversion, it must be brought low again to allow reading/writing during conversion. reading/writing should only occur up to t data and, because this time is limited, the host must use a fast sck. the sck frequency required is calculated by data t edges sck number sck f __ the time between t data and t conv is a safe time when digital activity should not occur, or sensitive bit decisions may be corrupt. reading/writing during acquisition, any speed hosts when reading/writing during acquisition (n), conversion results are for the previous (n ? 1) conversion, and writing is for the (n + 1) acquisition. for the maximum throughput, the only time restriction is that the reading/writing take place during the t acq (min) time. for slow throughputs, the time restriction is dictated by throughput required by the user, and the host is free to run at any speed. thus for slow hosts, data access must take place during the acquisition phase. reading/writing spanning co nversion, any speed host when reading/writing spanning conversion, the data access starts at the current acquisition (n) and spans into the conversion (n). conversion results are for the previous (n ? 1) conversion, and writing the cfg is for the next (n + 1) acquisition and conversion. similar to reading/writing during conversion, reading/writing should only occur up to t data . for the maximum throughput, the only time restriction is that reading/writing take place during the t acq (min) + t data time. for slow throughputs, the time restriction is dictated by the users required throughput, and the host is free to run at any speed. similar to the reading/writing during acquisition, for slow hosts, the data access must take place during the acquisition phase with additional time into the conversion. note that data access spanning conversion requires the cnv to be driven high to initiate a new conversion, and data access is not allowed when cnv is high. thus, the host must perform two bursts of data access when using this method.
ad7949 rev. a | page 22 of 28 configuration register, cfg the ad7949 uses a 14-bit configuration register (cfg[13:0]) as detailed in tabl e 9 for configuring the inputs, channel to be converted, one-pole filter bandwidth, reference, and channel sequencer. the cfg is latched (msb first) on din with 14 sck rising edges. the cfg update is edge dependent, allowing for asynchronous or synchronous hosts. the register can be written to during conversion, during acquis- ition, or spanning acquisition/conversion and is updated at the end of conversion, tconv (max). there is always a one deep delay when writing cfg. note that, at power up, the cfg is undefined, and two dummy conversions are required to update the register. to preload the cfg with a factory setting, hold din high for two conversions. thus cfg[13:0] = 0x3fff. this sets the ad7949 for ? in[7:0] unipolar referenced to gnd, sequenced in order ? full bandwidth for one-pole filter ? internal reference/temperature sensor disabled, buffer enabled ? no readback of cfg table 9 summarizes the configuration register bit details. see the theory of operation section for more details. 13 12 11 10 9 8 7 6 5 4 3 2 1 0 cfg incc incc incc inx inx inx bw ref ref ref seq seq rb table 9. configuration register description bit(s) name description <13> cfg configuration update. 0 = keep current configuration settings. 1 = overwrite contents of register. <12:10> incc input channel configuration. se lection of pseudobipolar, pseudodifferentia l, pairs, single-ended or temperature se nsor. refer to the input configurations section. bit 12 bit 11 bit 10 function 0 0 x bipolar differential pairs; inx? referenced to v ref /2 0.1 v. 0 1 0 bipolar; inx referenced to com = v ref /2 0.1 v. 0 1 1 temperature sensor. 1 0 x unipolar differential pairs; inx? referenced to gnd 0.1 mv. 1 1 0 unipolar, in0 to in7 referenced to com = gnd 0.1 v (gnd sense). 1 1 1 unipolar, in0 to in7 referenced to gnd. <9:7> inx input channel selection in binary fashion. bit 9 bit 8 bit 7 channel 0 0 0 in0 0 0 1 in1 1 1 1 in7 <6> bw select bandwidth for low-pass filter. refer to the selectable low pass filter section. 0 = ? of bw, uses an additional series resistor to further ba ndwidth limit the noise. maximum throughout must be reduced to ? also. 1 = full bw. <5:3> ref reference/buffer selection. selection of internal, and external , external buffered, and enabling of the on-chip temperature sensor. refer to the voltage reference output/input section. bit 5 bit 4 bit 3 function 0 0 0 internal reference, ref = 2.5 v output. 0 0 1 internal reference, ref = 4.096 v output. 0 1 0 external reference, temperature enabled. 0 1 1 external reference, internal buffer, temperature enabled. 1 1 0 external reference, temperature disabled. 1 1 1 external reference, internal buffer, temperature disabled. <2:1> seq channel sequencer. allows for scanning channe ls in an in0 to inx fashion. refer to the sequencer section. bit 2 bit 1 function 0 0 disable sequencer. 0 1 update configuration during sequence. 1 0 scan in0 to inx (set in cfg[9:7]), then temperature. 1 1 scan in0 to inx (set in cfg[9:7]). 0 rb read back the cfg register. 0 = read back current configuration at end of data. 1 = do not read back contents of configuration.
ad7949 rev. a | page 23 of 28 read/write spanning conversion without a busy indicator this mode is used when the ad7949 is connected to any host using an spi, serial port, or fpga. the connection diagram is shown in figure 33 , and the corresponding timing is given in figure 34 . for spi, the host should use cpha = cpol = 0. reading/writing spanning conversion is shown, which covers all three modes detailed in the digital interface section. a rising edge on cnv initiates a conversion, forces sdo to high impedance, and ignores data present on din. after a conversion is initiated, it continues until completion irrespective of the state of cnv. cnv must be returned high before the safe data transfer time, t data , and then held high beyond the conversion time, t conv , to avoid generation of the busy signal indicator. after the conversion is complete, the ad7949 enters the acquisition phase and powers down. when the host brings cnv low after t conv (max), the msb is enabled on sdo. the host also must enable the msb of cfg at this time (if necessary) to begin the cfg update. while cnv is low, both a cfg update and a data readback take place. the first 14 sck rising edges are used to update the cfg, and the first 13 sck falling edges clock out the conversion results starting with msb ? 1. the restriction for both configuring and reading is that they both occur before the t data time of the next conversion elapses. all 14 bits of cfg[13:0] must be written or they are ignored. also, if the 14-bit conversion result is not read back before t data elapses, it is lost. the sdo data is valid on both sck edges. although the rising edge can be used to capture the data, a digital host using the sck falling edge allows a faster reading rate, provided it has an acceptable hold time. after the 14 th (or 28 th ) sck falling edge, or when cnv goes high (whichever occurs first), sdo returns to high impedance. if cfg readback is enabled, the cfg associ- ated with the conversion result ( n ? 1 ) is read back msb first following the lsb of the conversion result. a total of 30 sck falling edges is required to return sdo to high impedance if this is enabled. miso mosi sck ss cnv for spi use cpha = 0, cpol = 0. sck sdo din ad7949 digital host 07351-036 figure 33. connection diagram for th e ad7949 without a busy indicator update (n) cfg/sdo update (n + 1) cfg/sdo acquisition (n) acquisition (n + 1) acquisition (n - 1) msb msb ? 1 1 2 begin data (n ? 1) begin cfg (n + 1) cfg msb t clsck t sdin t hdin t hsdo t dsdo t dis t dis lsb + 1 12 13 see note see note 14/ 28 conversion (n) return cnv high for no busy end data (n ? 1) end cfg (n + 1) cfg lsb x x t acq > t conv t conv t data t cnvh lsb sck cnv din sdo t en t en t en t dis t dis lsb + 1 12 13 14/ 28 conversion (n ? 1) return cnv high for no busy end data (n ? 2) end cfg (n) cfg lsb x x t conv t data lsb 07351-037 t cyc cfg msb ? 1 notes: 1. the lsb is for conversion results or the configuration register cfg (n ? 1) if 15 sck falling edges = lsb of conversion results. 29 sck falling edges = lsb of configuration register. on the 16th or 30th sck falling edge, sdo is driven to high impendance. (quiet time) (quiet time) figure 34. serial interface timing for the ad7949 without a busy indicator
ad7949 rev. a | page 24 of 28 read/write spanning conversion with a busy indicator this mode is used when the ad7949 is connected to any host using an spi, serial port, or fpga with an interrupt input. the connection diagram is shown in figure 35 , and the correspon- ding timing is given in figure 36 . for spi, the host should use cpha = cpol = 1. reading/writing spanning conversion is shown, which covers all three modes detailed in the digital interface section. a rising edge on cnv initiates a conversion, forces sdo to high impedance, and ignores data present on din. after a conversion is initiated, it continues until completion irrespective of the state of cnv. cnv must be returned low before the safe data transfer time, t data , and then held low beyond the conversion time, t conv , to generate the busy signal indicator. when the conversion is complete, sdo transitions from high impedance to low with a pull-up to vio, which can be used to interrupt the host to begin data transfer. after the conversion is complete, the ad7949 enters the acquisition phase and powers down. the host must enable the msb of cfg at this time (if necessary) to begin the cfg update. while cnv is low, both a cfg update and a data readback take place. the first 14 sck rising edges are used to update the cfg, and the first 14 sck falling edges clock out the conversion results starting with the msb. the restriction for both configuring and reading is that they both occur before the t data time elapses for the next conversion. all 14 bits of cfg[13:0] must be written or they are ignored. also, if the 14-bit conversion result is not read back before t data elapses, it is lost. the sdo data is valid on both sck edges. although the rising edge can be used to capture the data, a digital host using the sck falling edge allows a faster reading rate, provided it has an acceptable hold time. after the optional 14 th (or 28 th ) sck falling edge or when cnv goes high (whichever occurs first), sdo returns to high impedance. if cfg readback is enabled, the cfg associated with the conversion result ( n ? 1 ) is read back msb first following the lsb of the conversion result. a total of 29 sck falling edges is required to return sdo to high impedance if this is enabled. ad7949 miso mosi sck ss sdo v io for spi use cpha = 1, cpol = 1. sck cnv din digital host irq 07351-038 figure 35. connection diagram for the ad7949 with a busy indicator sck acquisition (n) acquisition (n + 1) cnv din sdo msb msb ? 1 1 2 begin data (n ? 1) beign cfg (n + 1) cfg msb lsb + 1 lsb 13 13 see note see note 14 14 15/ 29 15/ 29 conversion (n) conversion (n ? 1) (quiet time) end data (n ? 2) end data (n ? 1) end cfg (n + 1) end cfg (n) x xxx x x t data update (n + 1) cfg/sdo lsb + 1 lsb conversion (n ? 1) (quiet time) update (n) cfg/sdo t cyc t acq t hdin t hsdo t dsdo t sdin t data t conv t cnvh t dis t dis t dis t en t en t en cfg msb ?1 07351-039 notes: 1. the lsb is for conversion results or the configuration register cfg (n ? 1) if 16 sck falling edges = lsb of conversion results. 30 sck falling edges = lsb of configuration register. on the 17th or 31st sck falling edge, sdo is driven to high impendance. otherwise, the lsb remains active until the busy indicator is driven low. figure 36. serial interface timing for the ad7949 with a busy indicator
ad7949 rev. a | page 25 of 28 application hints layout the printed circuit board that houses the ad7949 should be designed so that the analog and digital sections are separated and confined to certain areas of the board. the pinout of the ad7949, with all its analog signals on the left side and all its digital signals on the right side, eases this task. avoid running digital lines under the device because these couple noise onto the die unless a ground plane under the ad7949 is used as a shield. fast switching signals, such as cnv or clocks, should not run near analog signal paths. crossover of digital and analog signals should be avoided. at least one ground plane should be used. it can be common or split between the digital and analog sections. in the latter case, the planes should be joined underneath the ad7949s. the ad7949 voltage reference input ref has a dynamic input impedance and should be decoupled with minimal parasitic inductances. this is done by placing the reference decoupling ceramic capacitor close to, ideally right up against, the ref and gnd pins and connecting them with wide, low impedance traces. finally, the power supplies vdd and vio of the ad7949 should be decoupled with ceramic capacitors, typically 100 nf, placed close to the ad7949 and connected using short, wide traces to provide low impedance paths and reduce the effect of glitches on the power supply lines. evaluating ad7949 performance other recommended layouts for the ad7949 are outlined in the documentation of the evaluation board for the ad7949 ( eval- ad7949cb z ). the evaluation board package includes a fully assembled and tested evaluation board, documentation, and software for controlling the board from a pc via the evaluation controller board, eval-control brd3 .
ad7949 rev. a | page 26 of 28 outline dimensions 2.65 2.50 sq 2.35 3.75 bsc sq 4.00 bsc sq compliant to jedec standards mo-220-vggd-1 012508-b 1 0.50 bsc p i n 1 i n d i c a t o r 0.50 0.40 0.30 top view 12 max 0.80 max 0.65 typ seating plane pin 1 indi c ator coplanarity 0.08 1.00 0.85 0.80 0.30 0.23 0.18 0.05 max 0.02 nom 0.20 ref 20 6 16 10 11 15 5 exposed pad (bottom view) 0.60 max 0.60 max 0.25 min figure 37. 20-lead lead frame chip scale package (lfcsp_vq) 4 mm 4 mm body, very thin quad (cp-20-4) dimensions shown in millimeters ordering guide model temperature range package description package option ordering quantity ad7949bcpz 1 C40c to +85c 20-lead qfn (lfcsp_vq) cp-20-4 tray, 490 ad7949bcpzrl7 1 C40c to +85c 20-lead qfn (lfcsp_vq) cp-20-4 reel, 1,500 eval-ad7949cbz 1 evaluation board eval-control brd3 2 controller board 1 z = rohs compliant part. 2 this controller board allows a pc to control and communicate with all analog devices evaluation boards whose model numbers end in cb.
ad7949 rev. a | page 27 of 28 notes
ad7949 rev. a | page 28 of 28 notes ?2008 analog devices, inc. all rights reserved. trademarks and registered trademarks are the property of their respective owners. d07351-0-5/08(a)

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